EXFO FTBx-5245 光谱分析仪

SPECTRAL MEASUREMENT: 

Wavelength range (nm):  1250 to 1650

Wavelength uncertainty (nm):  ±0.05; ±0.01

Reference : Internal  

Resolution bandwidth (RBW) (nm) : 0.065

Wavelength linearity (nm):  ±0.01 

Wavelength repeatability 2σ (nm) : ±0.003

Analysis mode : WDM, EDFA, drift, spectral transmittance, DFB, FP 

POWER MEASUREMENT: 

Dynamic range (dBm) (per channel):  –80 k to 18 

Maximum total safe power (dBm) : 23

Absolute power uncertainty (dB) : ±0.5 l 

Power repeatability 2σ (dB): ±0.02 

OPTICAL MEASUREMENT: 

Optical rejection ratio (dB)::

at 0.2 nm (25 GHz): 35 (40 typical)

at 0.4 nm (50 GHz): 45 (50 typical)

Channel spacing : 25 to 200 GHz, CWDM 

PDL (dB): ±0.08  

ORL (dB) : ≥40 

Measurement time (s) (includes scanning, analysis and display) : <1.0  

IN-BAND OSNR MEASUREMENT :  FTBx-5245-P only 

OSNR dynamic range (dB):  >35 

OSNR measurement uncertainty (dB):  ±0.5 

Repeatability (dB) : ±0.2 

Data signals : Up to 100 Gbit/s  

POL-MUX OSNR MEASUREMENT: 

Commissioning assistant: 

Modulation formats:  Any, including all coherent/Pol-Mux formats like DP-QPSK, DP-BPSK, DP-8-QAM, DP-16-QAM, DP-64-QAM

Data signals : Up to 400 Gbit/s

Measurements time:  1 min and 40 s (100 scans) for trace with all channels on;  <5 s for traces with a single channel off. 

GENERAL SPECIFICATIONS : 

Size (H x W x D):  51 mm x 159 mm x 185 mm (2 in x 6 1/4 in x 7 5/16 in)

Weight : 1.2 kg (2.6 lb)

Temperature: 

Operating: 0 °C to 40 °C (32 °F to 104 °F)

Storage: –40 °C to 50 °C (–40 °F to 122 °F)

Relative humidity:  0 % to 95 % noncondensing

Connectors : EI (EXFO UPC universal interface); EA (EXFO APC universal interface)

Datasheet