EXFO FTBx-5255 光谱分析仪

SPECTRAL MEASUREMENT: 

Wavelength range (nm):  1250 to 1650

Wavelength uncertainty (nm): ±0.025 (b); ±0.010 (b, c, d)

Reference : Internal 

Resolution bandwidth (RBW) (nm) : 0.065 (d, g): 

Wavelength linearity (nm): ±0.01 

Wavelength repeatability 2σ (nm) :  ±0.003

Analysis mode : WDM, EDFA, drift, spectral transmittance, DFB, FP

POWER MEASUREMENT: 

Dynamic range (dBm) (per channel): –80 k to 18

Maximum total safe power (dBm) : 23

Absolute power uncertainty (dB) : ±0.5 l 

Power repeatability 2σ (dB): ±0.02  

OPTICAL MEASUREMENT: 

Optical rejection ratio (dB):: 

at 0.2 nm (25 GHz): 45 (50 typical)

at 0.4 nm (50 GHz): 50 (55 typical)

Channel spacing : 12.5 to 200 GHz, CWDM

PDL (dB): ±0.06

ORL (dB) : ≥40

Measurement time (s) (includes scanning, analysis and display) : <1.0 

IN-BAND OSNR MEASUREMENT : 

OSNR dynamic range (dB):  >35 

OSNR measurement uncertainty (dB):  ±0.5 

Repeatability (dB) :  ±0.2 

Data signals : Up to 100 Gbit/s

POL-MUX OSNR MEASUREMENT: 

Commissioning assistant: 

Modulation formats:  Any, including all coherent/Pol-Mux formats like DP-QPSK, DP-BPSK, DP-8-QAM, DP-16-QAM, DP-64-QAM

Data signals : Up to 400 Gbit/s

Measurements time:  1 min and 40 s (100 scans) for trace with all channels on;  <5 s for traces with a single channel off. 

IN-SERVICE POL-MUX OSNR: 

OSNR dynamic range (dB) : 30

OSNR measurement uncertainty (dB) : ±0.5 

Repeatability (dB) : ±0.3 

GENERAL SPECIFICATIONS : 

Size (H x W x D):  51 mm x 159 mm x 185 mm (2 in x 6 1/4 in x 7 5/16 in)

Weight : 1.2 kg (2.6 lb)

Temperature: 

Operating: 0 °C to 40 °C (32 °F to 104 °F)

Storage: –40 °C to 50 °C (–40 °F to 122 °F)

Relative humidity:  0 % to 95 % noncondensing

Connectors : EI (EXFO UPC universal interface); EA (EXFO APC universal interface)

Datasheet