FISCHER GOLDSCOPE SD 520 XRF 分光光度计 (SDD Detector)

Non-destructive, fast and precise XRF gold test

Spacious measurement chamber

Compact and robust design, meant for long – and long-term – use

No sample preparation needed. Simply place the item on the measuring window in the measurement chamber

A camera shows you the exact measurement location

Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Measuring direction with measuring bottom up

1-fold changeable apertures

1-fold changeable filter

DPP+ digital pulse processor for higher count rates and significantly reduced measuring times

Fully protected instrument with type approval according to current radiation protection legislation

GOLDSCOPE SD 520 with silicon drift detector (SDD) for the highest resolution at lowest detection thresholds

Applications

Composition of precious metal alloys

Authenticity testing of gold jewelry, watches and coins

Analysis of dental alloys

Rhodium plating on gold alloys and gold plating on silver alloys

Multi-layer systems as substitute for materials with nickel content

Brochure