FISCHER FISCHERSCOPE X-RAY XAN 252 涂层测厚仪

Universal X-ray fluorescence (XRF) spectrometers for metal and precious-metal analysis, coating thickness measurement and RoHS screening according to DIN ISO 3497 and ASTM B 568

Premium semiconductor detectors (SDD) ensure excellent detection accuracy and high resolution

XAN 250 and 252: for measuring light elements like aluminum, silicon or sulfur 

Collimator: fixed or 4x changeable, smallest measuring spot approx. 0.3mm

Primary filter: fixed or 6x changeable

Fixed sample support or a manual XY stage

Video camera for easy location of the best measurement site

Up to 17 cm sample height

Applications

Non-destructive analysis of dental alloys, silver test

Multilayer coatings

Analysis of functional coatings at least 10 nm thick in the electronics and semiconductor industry

Trace analysis in consumer protection, e.g. testing for the presence of lead in toys

Metal-alloy determinations according to the highest accuracy requirements in the jewelry industry and in refineries

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