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Premium universal XRF analyzer for automated measurements of very thin coatings (< 0.05 μm) and for fine material analysis in the sub per mil range according to ISO 3497 and ASTM B 568
Extremely powerful silicon drift detector from Fischer with extra-large effective area (SDD 50 mm²)
6x changeable primary filter and 4x changeable collimators to optimize the measuring conditions
Analysis of light elements like aluminum, silicon and phosphorus
Sample heights up to 14 cm
High precision, programmable XY stage with positioning accuracy of < 5 µm for automated measurements on small structures
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Extremely robust construction for serial testing, with outstanding long-term stability
Certified fully protective device
Applications
Testing very thin coatings in the electronics and semiconductor industries, e .g. gold and palladium layers less than 50 nm thick
ENIG/ENEPIG
Measurement of hard material coatings in automotive manufacture
Coating thickness measurement in the photovoltaics industry
Trace analysis of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer goods
Analysis and authenticity testing of gold and other precious metals, as well as alloys thereof
Direct determination of the phosphorus content in functional NiP coatings
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