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Precision:
Constant temp. plate 1:
Temp. control precision: ±0.5℃
Temp. control range: 15~80℃
Constant temp. plate 2:
Stability: ±0.01℃
Temp. control range: -35~200℃
Voltage drop measurement: ±50μV
Tj measurement: ±2℃
Temp. measurement of cold plate & case: ±2℃
Gate current detection: 0.2nA-100uA; Resolution: 25pA
Capacity:
Rth/Zth/K Curve: 1 sample per single test
Power cycling (Unit: Second/Minute): 12 samples per single test
The K Curve Test:
Test current: Range: 0~3A; Precision: ≤0.1%+5mA; Resolution: 0.1mA
Constant temp. system: Temp. range: -35~200℃; Stability: ±0.01℃ (Depend on the equipment.)
Rth/Zth Test:
Tj test: Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃
Tc test: Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃
Fast turnoff: Sample Im can be removed within 1μs.
Zthjc/Zthja tests: Available
Display of integral/differential structure function curve: Available
Power Cycling Test (Unit: Second):
Power supply:
Output capacity>1800A
Current precision: ±0.1%set+0.4%FS
Tj test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
Tc test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
Typical conditions: 0.5s<tcycle<10s; Tjmax=150℃; ΔTjmax=60K; 130,000 cycles
Ageing mode: Constant current; Constant Tjmax/ΔTjmax; Constant power P
Data recording: IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS
Power Cycling Test (Unit: Minute):
Power supply:
Output capacity: >1800A/10V
Current precision: ±0.1%set+0.4%FS
Tj test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
Tc test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
Typical conditions: 2min<tcycle<6min; TCmin=25℃; ΔTjmax=80K; 2,000~5,000 cycles
Ageing mode: Constant current; Constant Tjmax/ΔTjmax; Constant power P
Data recording: IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS
