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Leeb UEE920 超音波测厚仪 (0~1250μm)

ModelUEE920
原产地China
保修12 个月
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Measuring principle: Magnetic induction (Fe ) & Eddy current ( NFe)

Measuring range (µm): 0~1250μm

Probe: Changeable

Shell: Plastic

Accuracy: ±(2%H+1) μm; H refers to the thickness of testing piece

Minimum resolution (µm): 0.1μm

Min curvature of the min area (mm): Convex1.5 Concave9

Diameter of the min area (mm): Φ7

Critical thickness of substrate (mm): 0.5

Memory: 1560

Dimensions: 163*78*33 mm

Power supply: 2*AA Alkaline battery

Standard Configuration: Main Machine, probe*1(Fe or NFe), substrate*1(Fe or NFe), software & USB, Calibration specimens*5, Users’ Manual, Qualified Certificate, AA battery*2, Packing list, Warranty card

Optional Accessories: Probes,Specimens


Coating Thickness Gauge 

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