Mahr 6910404 移动式表面测量仪 (M 400, ±250 µm)

Measuring principle: Stylus method

Probe: BFW skidless system

Measuring range: ±250 µm (up to ±750 µm with 3x probe arm length)

Profile resolution:

        ±250 µm: 8 nm

        ±25 µm: 0.8 nm

Filter according to ISO/JIS: Gaussian filter as per ISO 11562, Filter as per ISO 13565

Number n of sampling length according to ISO/JIS: 1– 5

Contacting speeds: 0.2 mm/s; 1.0 mm/s

Stylus: 2 µm

Measuring force: 0.75 mN

Weight measuring instrument: 1.0 kg

Accessories

Measuring stand

ST-D, ST-F and ST-G

Holder on measuring stand

Other accessories

CT 120 XY table, parallel vise, V-block

Assorted probe arms for the BFW probe system

Included: 

MarSurf M 400 evaluation instrument

MarSurf SD 26 drive unit including BFW 250 probe system

Standard probe arm (6852403)

1 roll of thermal paper

Wide-range power supply unit with 3 adapters

2 USB cables (for connecting to the PC and the M 400)

Operating instructions

Case