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Specification
Measured data
Parallel, perpendicular & unpolarized reflectance at 12 user selected angles between 8° and 80°.
Separation of the reflectance into diffuse and specular components.
Collimated and scattered transmittance at 0° incidence.
Directional emittance as a function of wavelength and temperature beyond 500°C.
Total hemispherical emittance as a function of temperature.
Data format selection: ERAS, ASTM tabular formats, graphical, linear and log scale, μm or cm-1, reflectance vs. wavelength, and reflectance vs. angle.
Spectre Software
Measurement Configuration: Automated reflectometer 18” electroformed hemiellipsoid mates to a stateof-the-art spectrometer.
Measurement Calibration: Comparison of scans of the specimen sample and calibrated specular gold standard at each angle polarization combination establishes accurate calibration of the measured directional reflectance.
Source: A custom heated cavity provides uniform 2π steradian radiation into the subtended hemiellipsoid from a 0.75” ID opening centered at one ellipse focus. All cavity surfaces, excepting the opening, are insulated with high performance Min-K insulation and the unit is surrounded by a water cooled jacket.
Spectral Range: Wavelength coverage depends on FTIR optics as shown in the following table.
λ(μm) cm-1
Standard 2.0 - 25.0 5000 - 400
Solid Substrate 14.0 - 200.0 700 - 50
Resolution: Depending on data requirement: 2, 4, 8, 16, or 32 cm-1 resolution may be employed.
Sample Size Standard: 1” OD. Sample mounting can accommodate up to 3” x 5” samples.
Computer Controller Measurements: The automated process is computer controlled by five stepper motors which provide: polarization (parallel, perpendicular and unpolarized), ariable incident angles, sample standard interchange, beamblocker angles. The source beam chopping is synchronized to the movement of the FTIR mirror which eliminates the sample self-emission error.
Applications
Emittance as a function of temperature and wavelength for heat transfer analysis
Provides full scattered transmittance data into large angles up to a hemisphere of 2π steradians.
Support of IR image simulation and IR material development
Identification and measurement of surface contaminants
Characterization of scatter and degree of specularity
Measurement of polarized reflectance data for calculation of optical constants (n, k) of bulk and powdered materials
Datasheet
