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TRI TR5001E SII In-Circuit Tester

ModelTR5001E SII
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Analog/Hybrid Test Points: 3456

Operating System: Microsoft® Windows 11

Fixture Type: Inline or Offline Press Type. Inline version with long-lifespan quick-disconnection interface.

Standard Testing Components

Analog Test Hardware:

6-wire measurement switching matrix

Programmable AC/DC/DC high-voltage and high-current sources

AC/DC voltage and DC current measurement

R/L/C component measurement

Optional Components

Analog Hardware:

TestJet: Vectorless open-circuit detection

Arbitrary Waveform Generator

Digital Testing:

Non-multiplexing 1:1 per-pin architecture with independent per-pin level setting

DUT Power Supplies:

5 V @ 3 A, 3.3 V @ 3 A, 12 V @ 3 A, -12 V @ 1 A and 24 V @ 3 A

Programmable Power (2 CH): 0.2–3 V @ 2 A max. or 3–24 V @ 3 A max.

DPS Programmable DUT Power Supply:

DPS3514: 30 V max. / 5 A max. / 100 W max. per channel / 4 CH per DPS

DPS3122: 30 V max. / 10 A max. / 200 W max. per channel / 2 CH per DPS

APPS7508: 75 V max. / 8 A max. / 200 W max.

Boundary Scan: Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE 1149.6 Test.

On-board Flash, EEPROM and MAC programming

ToggleScan Test: Advanced test technology that combines BScan and vectorless test functions to detect pin open or short issues.

Yield Management System: YMS 4.0

Industry 4.0 Standards: IPC-Hermes-9852, IPC-CFX

Board Handling

Max. PCB Size:

TR5001E SII: Standard – 420 × 300 mm; Optional – 600 × 350 mm

PCB Thickness: 0.6–5 mm

Dimensions (W × D × H):

TR5001E SII: 1000 × 900 × 1680–1700 mm

Note: Not including signal tower; signal tower height: 392 mm

Weight: TR5001E SII: 200 kg

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