Tunkia TD8160 单片非晶磁性能测量系统 (40~65Hz)

- Magnetic Parameter specifications:

Hm: 1 A/m～200 A/m [1]

Jm: 10 mT～1.7 T [2]

Bm: 10 mT～1.7 T [2]

Frequency: 40 Hz...65 Hz ( is customizable )

Note: [1] Hmax depends on the SST. [2] Jm,Bm depends on the material properties.

- Typical test points: Ps

Typical test points/ Uncertainty ( k = 2 )/ Repeatability:

P1.0/3.0%/1.0%

P1.3/3.0%/1.0%

P1.4/3.0%/1.0%

P1.5/3.0%/1.0%

- Typical test points: Bm

Typical test points/ Uncertainty ( k = 2 )/ Repeatability:

B25/1.0%/0.3%

B50/1.0%/0.3%

B80/1.0%/0.3%

- Single Sheet Tester (Optional)

- General Specifications: 

Power Supply: AC ( 220 ± 22 ) V，( 50 ± 2 ) Hz

Temperature Performance:

Operating Temperature：0°C～45°C

Storage Temperature：-20°C～70°C

Humidity Performance:

Operating Storage：< 80% @ 30°C，< 70% @ 40°C，< 40% @ 50°C

Storage Humidity：(20%～80%) R•H，non-condensing

1. Summary

TD8160 consists of excitation and measurement host, single sheet tester and computer software, etc.The product design conforms to the standard IEC 60404-16-2018, GB/T 19346.3-2021. Testingfrequency from 45 Hz to 65 Hz (400 Hz is customizable). It used for testing the ACmagneticproperties amorphous or Nano crystalline single sheet.

2. Application

Datasheet