HUATEC FD530MINI 超声波探伤仪
制造商: HUATEC Model: FD530MINI - 报价要求
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Technical Data
Range of scanning (mm): Range of scanning (mm):0~1000
D-delay (ms): D-delay (ms):0~5000
MTLVEL(m/s): MTLVEL:1000~9999
Working mode: Single probe (receiving and sending), double probe (one for receiving and another for sending), transmission (transmission probe)
Frequency Range (MHz): 0.5~10
Gain adjustment (dB): 0~110
Reject: 0%~80% of screen height
Vertical linear error: Vertical linear error is not more than 3%
Horizontal linear error: Not more than 0.1% in the scanning range
Sensitivity Leavings: ≥50 dB
Dynamic range: ≥36dB
Alarm: Three modes, i.e. forbidden wave, loss wave and auto
A-Scan display area : Full screen or local; A-Scan display freezing and de-freezing A-Scan filling
Data save : 500 A-Scan images (including setting of instrument)
Standard communication interface with PC: USB
Measuring unit: mm/inch
Battery: Li battery 3.6V 3000mAh * 4
Power adaptor: 4.2V DC 220AC
Working temperature: -20℃~50℃
Working humidity: 20%~90%
Port type: LEMO
Overall dimension (mm): 162×105×42
Weight (kg): 0.68 (include Li-ion battery)
Standard delivery
Main unit: 1
4.2V power adaptor: 1
probe connecting cable: 1
Carrying case: 1
Instruction manual: 1
Straight probe: 1 (Dia 20mm, 2.5MHz)
Angle probe: 1 (13×13, 60°, 2.5MHz)
Performance Features
The dual CPUs work in coordination, high speed detecting and data processing;
Automatic calibration;
Easy tests of thickness and sound velocity of materials;
Freely set standards for various industries to meet different flaw detection
Automated display precise flaw location(Depth d,level p,distance s,amplitude,dB,diameter ф);
Freely set standards for various industries to meet different flaw detection;
The echo suppression is adjustable from 0 to 90%, without affecting the dB gain and linearity;
DAG and AVG(DGS) curves are generated automatically;
Muti-functions for easy detection: peak memory, Display freeze, automatic gain & wave search;
Li -battery, continue working time up to 10 hours;
Storage: 500 sets of flaw detection process and data storage;
Provides high contrast viewing of the waveform from bright, direct sunlight to complete darkness and easy to read from all angles;
USB connects to computer,automatically generate flaw detection report;
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