Tunkia TD8160 单片非晶磁性能测量系统 (40~65Hz)
制造商: Tunkia Model: TD8160 P/N: TD8160-65Hz - 报价要求
- 报价要求
- 联系
- Magnetic Parameter specifications:
Hm: 1 A/m~200 A/m [1]
Jm: 10 mT~1.7 T [2]
Bm: 10 mT~1.7 T [2]
Frequency: 40 Hz...65 Hz ( is customizable )
Note: [1] Hmax depends on the SST. [2] Jm,Bm depends on the material properties.
- Typical test points: Ps
Typical test points/ Uncertainty ( k = 2 )/ Repeatability:
P1.0/3.0%/1.0%
P1.3/3.0%/1.0%
P1.4/3.0%/1.0%
P1.5/3.0%/1.0%
- Typical test points: Bm
Typical test points/ Uncertainty ( k = 2 )/ Repeatability:
B25/1.0%/0.3%
B50/1.0%/0.3%
B80/1.0%/0.3%
- Single Sheet Tester (Optional)
- General Specifications:
Power Supply: AC ( 220 ± 22 ) V,( 50 ± 2 ) Hz
Temperature Performance:
Operating Temperature:0°C~45°C
Storage Temperature:-20°C~70°C
Humidity Performance:
Operating Storage:< 80% @ 30°C,< 70% @ 40°C,< 40% @ 50°C
Storage Humidity:(20%~80%) R•H,non-condensing
1. Summary
TD8160 consists of excitation and measurement host, single sheet tester and computer software, etc.The product design conforms to the standard IEC 60404-16-2018, GB/T 19346.3-2021. Testingfrequency from 45 Hz to 65 Hz (400 Hz is customizable). It used for testing the ACmagneticproperties amorphous or Nano crystalline single sheet.
2. Application
Datasheet
- 质量承诺
- 正品保修
- 送货到家
- 交易简单化