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Universal X-ray fluorescence spectrometer for automated measurements on layers <0.0 5μm and for material analysis in the ppm range according to DIN ISO 3497 and ASTM B 568
SDD detector
3x changeable primary filters
4x changeable collimators
Smallest measuring spot approx. 0.15 mm
Sample heights up to 14 cm
Programmable XY stage with positioning accuracy of 10 µm
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Slotted housing for measuring on large printed circuit boards
Certified fully protective device
Applications
Material analysis of coatings and alloys (also thin coatings and low concentrations)
Electronics industry, ENIG/ENEPIG
Connectors and contacts
Gold, jewelry and watchmaking industry
Measurement of thin (a few nanometers) gold and palladium coatings in PCB manufacturing
Analysis of trace elements
Determination of lead (Pb) for high-reliability applications (tin-whisker avoidance)
Analysis of hard material coatings
Brochure
