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Santec TMS-2000 Wafer Thickness Mapping System (1 nm) | EMIN.VN

Optical equipment
Santec TMS-2000 Wafer Thickness Mapping System (1 nm)

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Santec TMS-2000 Wafer Thickness Mapping System (1 nm)

In Stock: 0 Unit

ManufacturerSantec

ModelTMS-2000

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Quality Engagement

Easy change and return

Delivery Available

1. High Accuracy

High accuracy measurement using interferometric detection technique (1 nm repeatability)

2. Industry Standard Parameters

Analysis of Global (GFLR, GFLD, GBIR), Site (SFQR, SFQD, SBIR), Edge (ESFQR) possible

3. High Environmental Resistance

No temperature control or vibration countermeasures are required due to environmental durability

Small form factor suitable for multiple applications

4. Compact Size

Analysis Software

Thickness Measurement Site Analysis Edge Analysis

5. High Speed

Spiral Scanning (High speed, high density)

Note: Customers are advised to carefully read the Datasheet to select the correct ordering code that meets their usage requirements.

Datasheet

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