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Specification
Measurement Capabilities: Total reflectance (directional hemispheric reflectance, DHR)
Computed Measurements
Directional & hemispheric thermal emissivity.
Note that measurements must be made at ambient temperatures. Emissivity can be calculated by ET100 software for various temperatures; user input temperature function
With External Computation: Combining 410 Solar & ET-100 data allows for the manual computation of solar reflectance index (SRI) in accordance with ASTM E1980
Measurement Geometry: Integrating sphere with 20°/H & 60°/H geometry (directional illumination at 20° or 60° with hemispheric collection)
Illumination Source: 1000°C thermal filament source
Measurement Range: 6 bands in the 1.5-21μm range (1.5-2; 2-3; 3-4; 4-5; 5-10; & 10-21μm)
Measurement Spot Size: 12.7mm diameter
Measurement Time: 10 seconds
Sample Types: Flat or curved surfaces; convex and concave surfaces to have a maximum 150 & 300mm radius, respectively
Calibration: Supplied gold standard of specular reflectance
Compliance
ASTM E408 (Total Normal Emittance of Surfaces Using Inspection-Meter Techniques)
ASTM E1980 (Standard Practice for Calculating Solar Reflectance Index of Horizontal and Low-Sloped Opaque Surface) – when used with 410 Solar measurement head
Power: Rechargeable LiMH battery; 2 hours run-time on one battery charge (1 hour recharge time)
Dimensions: 293 x 230 x 94mm
Weight: 2.13kg
Applications
Space Coatings: Thermal control | α/ε | Thermo-optical properties
Defense | Aerospace: IR Signature | Low observable paint & coatings
Radiative Heat Transfer: Absorptance for thermal modeling
Semiconductors: Wafer fab hardware emissivity
Cool Building Materials: SRI | ASTM | LEED
Energy: Nuclear | Concentrated Solar
Datasheet