Ophir Ge/3.5/1.8μm Scanning Slit Beam Profiler With NanoScan (700-1800nm)
Manufacturer: Ophir Model: Ge/3.5/1.8μm P/N: PH00467 - Contact
See more: Equipment Calibration-Inspection & Repair Service
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Hanoi city: (024) 35.381.269
Danang city: (023) 63.747.711
Bac Ninh city: (0222) 730.39.68
Hai Phong city: (0225) 730.03.89
HCM city: (028) 38.119.636
Dong Nai: 0932.160.940
Wavelengths: 700-1800nm
Slit size: 1.8μm
Beam Sizes: 7μm-~2.3mm
Spatial sampling resolution: 5.3nm-18.3μm
Scan frequency: 1.25, 2.5, 5, 10, 20Hz
Bus Interface: USB 2.0
Sensor Type: Germanium
Compatible Light Sources: CW, Pulsed >25kHz
Power Range: ~10nW - ~10W
Aperture Size: 3.5mm
Scanhead Size: 83mm
Weight: 434g (15.3 ounces)
Operating temperature: 0-50ºC
Humidity: 90%, non-condensing
Scanhead dimensions: 76.8mm L x 63.5mm Ø
CPU clock: 300MHz
Memory clock: 264MHz
Compliance: CE, UKCA, China RoHS
NanoScan Professional: NS2s-Ge/3.5/1.8-PRO
- Quality Engagement
- Easy change and return
- Delivery Avaliable
- Favorable payment
